Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3(0001) surface.
about
Advances in atomic force microscopyMechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force MicroscopyVersatile system for the temperature-controlled preparation of oxide crystal surfaces.Recent trends in surface characterization and chemistry with high-resolution scanning force methods.Electronegativity determination of individual surface atoms by atomic force microscopy.Characterization of the mechanical properties of qPlus sensors.Concept for support and heating of plate-like samples in the ultra-high vacuum.Time-resolved and photoluminescence spectroscopy of θ-Al₂O₃ nanowires for promising fast optical sensor applications.Atom inlays performed at room temperature using atomic force microscopy.Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films.Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonatorsEnhanced atomic corrugation in dynamic force microscopy—The role of repulsive forcesFirst-principles study of the optical transitions ofFcenters in the bulk and on the (0001) surface ofα−Al2O3Resolving oxide surfaces - From point and line defects to complex network structuresImaging of individual adatoms on oxide surfaces by dynamic force microscopyAtomic resolution on a metal single crystal with dynamic force microscopyAtomically resolved force microscopy images of complex surface unit cells: Ultrathin alumina film on NiAl(110)Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuumImaging physical phenomena with local probes: From electrons to photonsThe stability of the hydroxylated (0001) surface of α-Al2O3Adsorption of Cu and Pd on α-Al2O3(0001) surfaces with different stoichiometriesNoncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesIdentifying the absolute orientation of a low-symmetry surface in real spaceReal topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of theα−Sn∕Si(111)−(3×3)R30°surface
P2860
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P2860
Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3(0001) surface.
description
2001 nî lūn-bûn
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2001年の論文
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2001年学术文章
@wuu
2001年学术文章
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2001年学术文章
@zh-cn
2001年学术文章
@zh-hans
2001年学术文章
@zh-my
2001年学术文章
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@yue
2001年學術文章
@zh-hant
name
Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3
@nl
Imaging the atomic arrangement ...... ted alpha-Al2O3(0001) surface.
@en
type
label
Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3
@nl
Imaging the atomic arrangement ...... ted alpha-Al2O3(0001) surface.
@en
prefLabel
Imaging the atomic arrangements on the high-temperature reconstructed alpha-Al2O3
@nl
Imaging the atomic arrangement ...... ted alpha-Al2O3(0001) surface.
@en
P356
P1433
P1476
Imaging the atomic arrangement ...... ted alpha-Al2O3(0001) surface.
@en
P2093
P2888
P356
10.1038/35102031
P407
P577
2001-11-01T00:00:00Z
P6179
1038272705