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Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacksSingle-molecule electrical contacts on silicon electrodes under ambient conditions.Drawing circuits with carbon nanotubes: scratch-induced graphoepitaxial growth of carbon nanotubes on amorphous silicon oxide substratesEffects of oxygen adsorption on the surface state of epitaxial silicene on Ag(111).Functionalization of silicon nanowire arrays by silver nanoparticles for the laser desorption ionization mass spectrometry analysis of vegetable oils.Band engineering in a van der Waals heterostructure using a 2D polar material and a capping layerWet chemical routes to the assembly of organic monolayers on silicon surfaces via the formation of Si-C bonds: surface preparation, passivation and functionalization.Mechanochemically Reduced SiO2 by Ti Incorporation as Lithium Storage Materials.In vitro evaluation of the effects of yttria-alumina-silica microspheres on human keratinocyte cells.Three-dimensional imaging for precise structural control of Si quantum dot networks for all-Si solar cells.Electronic structure of sub-10 nm colloidal silica nanoparticles measured by in situ photoelectron spectroscopy at the aqueous-solid interface.Effects of H2 High-pressure Annealing on HfO2/Al2O3/In0.53Ga0.47As Capacitors: Chemical Composition and Electrical Characteristics.Hydrogen generation by reaction of Si nanopowder with neutral water.Direct electrochemistry of cytochrome c at modified Si(100) electrodes.Polypeptide-catalyzed biosilicification of dentin surfaces.X-ray absorption near-edge structure anomalous behaviour in structures with buried layers containing silicon nanocrystals.The complex interface chemistry of thin-film silicon/zinc oxide solar cell structures.Effects of the c-Si/a-SiO2 interfacial atomic structure on its band alignment: an ab initio study.Chemical and kinetic insights into the Thermal Decomposition of an Oxide Layer on Si(111) from Millisecond Photoelectron Spectroscopy.Electronic structure of α-sexithiophene ultrathin films grown on.Large-Diameter TiO2 Nanotubes Enable Wall Engineering with Conformal Hierarchical Decoration and Blocking Layers for Enhanced Efficiency in Dye-Sensitized Solar Cells (DSSC).Spectral sharpening algorithm for a polychromatic reflectometer in the extreme ultraviolet.Redistribution of valence and conduction band states depending on the method of modification of SiO2 structure.Spherosiloxane H8Si8O12 clusters on Si(001): First-principles calculation of Si 2p core-level shifts.Theory of Si 2p core-level shifts at the Si(001)-SiO2 interface.Si 2p core-level shifts at the Si(001)-SiO2 interface: A first-principles study.Origin of fine structure in si photoelectron spectra at silicon surfaces and interfaces.Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions.Molecular composition and orientation of interstitial versus surface silicon oxides for Si(111)/SiO2 and Si(100)/SiO2 interfaces using FT-IR and X-ray photoelectron spectroscopies.Crystalline-vitreous interface in two dimensional silica.Evolution of metallic screening in small metal clusters probed by PCI-Auger spectroscopy.Ordering in thermally oxidized silicon.Surfactants in epitaxial growth.Graphene-like silicon nanoribbons on Ag(110): A possible formation of siliceneAdditive nanoscale embedding of functional nanoparticles on silicon surfaceDirect observation of site-specific valence electronic structure at theSiO2∕SiinterfaceElectron Trapping at Point Defects on Hydroxylated Silica SurfacesHigh-temperature vesuvianite: crystal chemistry and surface considerationsCrystal chemistry, surface morphology and X-ray photoelectron spectroscopy of Fe-rich osumilite from Mt. Arci, Sardinia (Italy)Light Emission from Nanocrystalline Si Inverse Opals and Controlled Passivation by Atomic Layer Deposited Al2O3
P2860
Q28822463-3D31F6EE-F2AA-44D0-8967-B442921EA250Q33587045-0450D9EE-DC31-4D07-ABBE-1074D93C84D6Q33749495-978D3DAE-D6A4-4C0C-9B77-3AA98A885C09Q34454461-CF17CAED-9971-47E2-97F1-DEABD356C6A5Q36091198-4A7631CC-8826-441A-AF71-2649390FAF39Q37005610-1AE459BB-92E2-491D-91AC-08C03DE6F552Q37731364-E359B959-9293-4FB4-95AB-DD9D50A4996DQ38423801-22FC8091-877C-4576-B8E4-D0C2D4662902Q39298688-65D577EA-937D-422D-B064-EBF2644D21EDQ39389618-441C25F4-2595-4039-B597-29906B8BAB89Q39737629-CCEA4625-65B6-4250-BAF2-9274D3A61B7BQ41548401-F0C9C7A4-CDD7-42A7-A177-6DBE2D15FB74Q41774688-132D569B-7138-4FC8-BB12-82A9C9A1F8F2Q43096923-EA7CFB63-CE38-48BF-971B-5BF6411DFEC8Q46029739-1E8C3B5E-7735-4104-BF6B-0626E0198873Q46404399-C0CB5842-C376-4253-A9FA-785D2B1C6EB4Q46819145-8CA00ABD-5326-4E68-8566-B9A34904A2E2Q46861651-41D078C8-4433-45F6-B811-8CD38BAA73BDQ47125585-C497917C-AF63-46B2-80E8-7F7041B932C1Q47251139-5F828B1F-F332-497B-AC5A-5E8C3CE779D1Q47928034-C92E953F-2166-461D-92F1-6984EB35C811Q48561705-64B6D951-5DEF-4213-AF32-CA5C5E95F7A2Q49994857-56355265-2921-4F6B-941A-CB39E6276308Q50112828-FA607421-36E7-4A10-83D7-8C24D2D504B7Q50113177-F5F8F63E-C713-46F4-A3BD-000BB7AE0D2DQ50114674-250689D3-A9D6-4706-BE28-CC674F59B3BDQ51197987-4B41F937-F572-41A5-A613-256BDB0E680EQ51308468-F0C285A0-F7E9-4524-851C-3B00BCA23BABQ51598589-BA60A20B-0219-40AA-A99D-EF0B8AA6D1C8Q52886742-7ACF93DE-21A3-4139-AC20-C7232600CE86Q52903019-BD2A847C-3E1E-4370-A177-E324148ADAF0Q53635681-D30FF88E-C043-4164-BE47-87AC5270BC34Q54542896-EECA2429-0079-4C15-B5FD-4CEC0110E12CQ56776229-FD01FB12-2518-4403-95D5-A5183100C74BQ56987697-796C05FD-A1A7-4931-A94C-CBBAE70565C4Q57739295-85D89F6F-3CA2-4C63-BAB8-BDED29DA4EB4Q57783789-660E7591-8465-49CE-B7E1-4E384D192939Q57877207-D65984A0-C17D-4C72-9B30-8EA694046641Q57877221-26376333-2421-4569-9DB3-5FA834D1A1D4Q57935860-6C0EF0C2-2EB5-4700-BCEB-89BBCC4F837D
P2860
description
im September 1988 veröffentlichter wissenschaftlicher Artikel
@de
scientific article published on 01 September 1988
@en
wetenschappelijk artikel
@nl
наукова стаття, опублікована у вересні 1988
@uk
name
Microscopic structure of theSiO2/Si interface
@en
Microscopic structure of theSiO2/Si interface
@nl
type
label
Microscopic structure of theSiO2/Si interface
@en
Microscopic structure of theSiO2/Si interface
@nl
prefLabel
Microscopic structure of theSiO2/Si interface
@en
Microscopic structure of theSiO2/Si interface
@nl
P2093
P356
P1433
P1476
Microscopic structure of the SiO2/Si interface
@en
P2093
Hollinger G
McFeely FR
Taleb-Ibrahimi A
Yarmoff JA
P2860
P304
P356
10.1103/PHYSREVB.38.6084
P407
P577
1988-09-01T00:00:00Z