Separation of interactions by noncontact force microscopy
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Noncontact atomic force microscopy simulator with phase-locked-loop controlled frequency detection and excitationPhantom Force Induced by Tunneling Current: A Characterization on Si(111)Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy.Voltage preamplifier for extensional quartz sensors used in scanning force microscopy.An in vivo study of electrical charge distribution on the bacterial cell wall by atomic force microscopy in vibrating force mode.Analysis of dispersive interactions at polymer/TiAlN interfaces by means of dynamic force spectroscopy.Direct determination of the energy required to operate a single molecule switch.Are electrostatic potentials between regions of different chemical composition measurable? The Gibbs-Guggenheim Principle reconsidered, extended and its consequences revisited.New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.Understanding the atomic-scale contrast in Kelvin probe force microscopy.Accurate Extraction of Electrostatic Force by a Voltage-Pulse Force Spectroscopy.Scanning nonlinear dielectric potentiometry.Room-temperature-concerted switch made of a binary atom cluster.Energy dissipation in dynamic force microscopy on KBr(001) correlated with atomic-scale adhesion phenomenaMultiscale approach for simulations of Kelvin probe force microscopy with atomic resolutionRapid reconstruction of a strong nonlinear property by a multiple lock-in techniqueUltrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurementsSystematic Achievement of Improved Atomic-Scale Contrast via Bimodal Dynamic Force MicroscopyTime-averaged cantilever deflection in dynamic force spectroscopyThree-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theoryAtomic resolution on a metal single crystal with dynamic force microscopyFrequency-modulated atomic force spectroscopy on NiAl(110) partially covered with a thin alumina filmPhase noise induced due to amplitude fluctuations in dynamic force microscopyDynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling currentExperimental aspects of dissipation force microscopyNoncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesDiscriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy
P2860
Q21708411-01B5C2F8-67A3-4FC3-9701-7561B1861FC7Q27335778-E5B8F208-D3C4-4001-9923-B6AD0464ADE4Q37496749-22D1D76F-1943-4B21-A1D7-C10B6EFBA744Q39733330-971EAF6D-4BAD-4325-9A00-8868E8733594Q41018723-10FDC33F-EB3F-4CF3-B854-3DAEF96F8215Q47404628-F4CAAE9B-564A-45B2-84E0-784FB9C52111Q50325245-5E988E0F-4B6F-4648-A2DB-890E5CBA6E99Q50854265-DE2BFC92-1F09-424C-AE28-D770095F2A20Q52904578-05C65EDE-8561-4CA6-B021-87EC3D405B68Q53059385-39FCF538-9D44-4949-AAC8-D7B80BD4DB55Q53178107-7D9B1571-01AE-4BB0-9E93-7CD02173968DQ53184417-54AD42F5-80E3-4E5F-9CC9-D08089F52011Q53320036-791674FC-514F-4CD6-8EDF-55AD836C8777Q57739287-03D8070E-4046-418A-AF87-C597CFAA1504Q57739297-818E21BB-8337-4D51-B760-1B3C7123BAE2Q57739301-C1458112-B0B8-4CA1-AE85-3A4E5C981A6BQ57739351-6B26BD44-B213-4597-B913-6BF6A44C0472Q57739377-E4C05903-D22D-4BB7-8055-F7FE72E48AE8Q57739382-1B4014AC-B8D6-4433-BBFC-4C656871A445Q58319982-24FAF3B9-B27B-4B06-847D-ED0B115F0200Q58320010-CBEB1663-4973-4064-B2FD-520E330385E8Q58320076-4C159A94-06D4-4D3E-BD62-831355C37DA4Q58642436-34C019FF-1DC7-450A-B3FE-9AFF1FA39B83Q58642570-A4D3EB70-599E-4C60-8F91-C1EF5A49E052Q58642575-147688F1-6EA8-4AE1-BEA1-3C14988E79E4Q59001855-6816D594-F453-43DD-A70F-251467257076Q59204916-E1D0019F-C747-4069-B3F7-5E7398903EB1
P2860
Separation of interactions by noncontact force microscopy
description
im April 2000 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
@nl
наукова стаття, опублікована у квітні 2000
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name
Separation of interactions by noncontact force microscopy
@en
Separation of interactions by noncontact force microscopy
@nl
type
label
Separation of interactions by noncontact force microscopy
@en
Separation of interactions by noncontact force microscopy
@nl
prefLabel
Separation of interactions by noncontact force microscopy
@en
Separation of interactions by noncontact force microscopy
@nl
P2093
P2860
P1433
P1476
Separation of interactions by noncontact force microscopy
@en
P2093
A. Abdurixit
A. Baratoff
H.-J. Güntherodt
M. Bammerlin
M. Guggisberg
O. Pfeiffer
R. Bennewitz
V. Barwich
P2860
P304
11151-11155
P356
10.1103/PHYSREVB.61.11151
P407
P577
2000-04-15T00:00:00Z