Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
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Forces and frequency shifts in atomic-resolution dynamic-force microscopyAdvances in atomic force microscopySeparation of interactions by noncontact force microscopyMolecular impurities at the NaCl(100) surface observed by scanning force microscopyNoncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesPhysical interpretation of frequency-modulation atomic force microscopyAtomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
P2860
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P2860
Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
description
wetenschappelijk artikel
@nl
наукова стаття, опублікована в березні 1996
@uk
name
Atomic resolution in dynamic force microscopy across steps on Si
@nl
Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
@en
type
label
Atomic resolution in dynamic force microscopy across steps on Si
@nl
Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
@en
prefLabel
Atomic resolution in dynamic force microscopy across steps on Si
@nl
Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
@en
P2093
P356
P1476
Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7
@en
P2093
A. Baratoff
Ch. Gerber
H.-J. Güntherodt
M. Bammerlin
T. Lehmann
P304
P356
10.1007/S002570050106
P577
1996-03-01T00:00:00Z