about
Electrically controlling single-spin qubits in a continuous microwave fieldStoring quantum information for 30 seconds in a nanoelectronic device.Spatial metrology of dopants in silicon with exact lattice site precision.Coherent control of a single ²⁹Si nuclear spin qubit.Transport of spin qubits with donor chains under realistic experimental conditions
P2860
description
2013 nî lūn-bûn
@nan
2013年の論文
@ja
2013年学术文章
@wuu
2013年学术文章
@zh
2013年学术文章
@zh-cn
2013年学术文章
@zh-hans
2013年学术文章
@zh-my
2013年学术文章
@zh-sg
2013年學術文章
@yue
2013年學術文章
@zh-hant
name
Noninvasive spatial metrology of single-atom devices.
@en
Noninvasive spatial metrology of single-atom devices.
@nl
type
label
Noninvasive spatial metrology of single-atom devices.
@en
Noninvasive spatial metrology of single-atom devices.
@nl
prefLabel
Noninvasive spatial metrology of single-atom devices.
@en
Noninvasive spatial metrology of single-atom devices.
@nl
P2093
P50
P356
P1433
P1476
Noninvasive spatial metrology of single-atom devices.
@en
P2093
Andrea Morello
Fahd A Mohiyaddin
Rachpon Kalra
P304
P356
10.1021/NL303863S
P407
P577
2013-04-18T00:00:00Z